Design, Modeling and Testing of Data Converters
Overview of attention for book
Table of Contents
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Altmetric BadgeBook Overview
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Altmetric BadgeChapter 1 A Power-Optimized High-Speed and High-Resolution Pipeline ADC with a Parallel Sampling First Stage for Broadband Multi-Carrier Systems
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Altmetric BadgeChapter 2 Design of Power, Dynamic Range, Bandwidth and Noise Scalable ADCs
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Altmetric BadgeChapter 3 Current and Emerging Trends in the Design of Digital-to-Analog Converters
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Altmetric BadgeChapter 4 Digitally-Based Calibration Techniques for RF $$ \Upsigma \Updelta $$ Σ Δ Modulators
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Altmetric BadgeChapter 5 Incremental and Extended-Range Data Converters
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Altmetric BadgeChapter 6 Event-Driven Successive Charge Redistribution Schemes for Clockless Analog-to-Digital Conversion
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Altmetric BadgeChapter 7 Time-to-Digital Converters
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Altmetric BadgeChapter 8 Look-Up Tables, Dithering and Volterra Series for ADC Improvements
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Altmetric BadgeChapter 9 A/D Conversion with Non-uniform Differential Quantization
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Altmetric BadgeChapter 10 Dynamic Testing of Analog-to-Digital Converters by Means of the Sine-Fitting Algorithms
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Altmetric BadgeChapter 11 Histogram-Based Techniques for ADC Testing
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Altmetric BadgeChapter 12 DAC Standardization and Advanced Testing Methods
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Altmetric BadgeChapter 13 Uncertainty Analysis of Data Converters Testing Parameters
Attention for Chapter 6:
Event-Driven Successive Charge Redistribution Schemes for Clockless Analog-to-Digital Conversion