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| Chapter title |
Signature-Based Reliability Analysis
|
|---|---|
| Chapter number | 5 |
| Book title |
Design, Analysis and Test of Logic Circuits Under Uncertainty
|
| Published by |
Springer, Dordrecht, January 2013
|
| DOI | 10.1007/978-90-481-9644-9_5 |
| Book ISBNs |
978-9-04-819643-2, 978-9-04-819644-9
|
| Authors |
Smita Krishnaswamy, Igor L. Markov, John P. Hayes, Krishnaswamy, Smita , Markov, Igor L., Hayes, John P. |