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Mendeley readers
| Chapter title |
CMOS Reliability Overview
|
|---|---|
| Chapter number | 2 |
| Book title |
Analog IC Reliability in Nanometer CMOS
|
| Published by |
Springer, New York, NY, January 2013
|
| DOI | 10.1007/978-1-4614-6163-0_2 |
| Book ISBNs |
978-1-4614-6162-3, 978-1-4614-6163-0
|
| Authors |
Elie Maricau, Georges Gielen, Maricau, Elie, Gielen, Georges |
Mendeley readers
The data shown below were compiled from readership statistics for 7 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| India | 1 | 14% |
| Unknown | 6 | 86% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Student > Ph. D. Student | 2 | 29% |
| Lecturer > Senior Lecturer | 1 | 14% |
| Student > Postgraduate | 1 | 14% |
| Student > Doctoral Student | 1 | 14% |
| Unknown | 2 | 29% |
| Readers by discipline | Count | As % |
|---|---|---|
| Engineering | 5 | 71% |
| Unknown | 2 | 29% |