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Mendeley readers
| Title |
Analog IC Reliability in Nanometer CMOS
|
|---|---|
| Published by |
Springer New York, January 2013
|
| DOI | 10.1007/978-1-4614-6163-0 |
| ISBNs |
978-1-4614-6162-3, 978-1-4614-6163-0
|
| Authors |
Maricau, Elie, Gielen, Georges |
Mendeley readers
The data shown below were compiled from readership statistics for 70 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| Germany | 2 | 3% |
| Belgium | 1 | 1% |
| Unknown | 67 | 96% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Student > Ph. D. Student | 31 | 44% |
| Researcher | 11 | 16% |
| Student > Doctoral Student | 7 | 10% |
| Student > Bachelor | 4 | 6% |
| Student > Master | 4 | 6% |
| Other | 8 | 11% |
| Unknown | 5 | 7% |
| Readers by discipline | Count | As % |
|---|---|---|
| Engineering | 50 | 71% |
| Computer Science | 5 | 7% |
| Materials Science | 4 | 6% |
| Physics and Astronomy | 2 | 3% |
| Business, Management and Accounting | 1 | 1% |
| Other | 1 | 1% |
| Unknown | 7 | 10% |