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Helium Ion Microscopy

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Attention for Chapter 8: Working with Other Ion beams
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Chapter title
Working with Other Ion beams
Chapter number 8
Book title
Helium Ion Microscopy
Published by
Springer, New York, NY, January 2013
DOI 10.1007/978-1-4614-8660-2_8
Book ISBNs
978-1-4614-8659-6, 978-1-4614-8660-2
Authors

David C. Joy, Joy, David C.