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Chapter title |
Electron Spin Resonance (ESR) Study on the Thermal Annealing of Defects Induced in Neutron Transmutation Doped Silicon
|
---|---|
Chapter number | 8 |
Book title |
Neutron-Transmutation-Doped Silicon
|
Published by |
Springer, Boston, MA, January 1981
|
DOI | 10.1007/978-1-4613-3261-9_8 |
Book ISBNs |
978-1-4613-3263-3, 978-1-4613-3261-9
|
Authors |
V. Q. Ho, T. Sugano, Ho, V. Q., Sugano, T. |