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Surface Science Tools for Nanomaterials Characterization

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Cover of 'Surface Science Tools for Nanomaterials Characterization'

Table of Contents

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    Book Overview
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    Chapter 1 Scanning Electrochemical Potential Microscopy (SECPM) and Electrochemical STM (EC-STM)
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    Chapter 2 Recovering Time-Resolved Imaging Forces in Solution by Scanning Probe Acceleration Microscopy: Theory and Application
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    Chapter 3 Scanning Probe Microscopy for Nanolithography
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    Chapter 4 Kelvin Probe Force Microscopy in Nanoscience and Nanotechnology
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    Chapter 5 Field Ion Microscopy for the Characterization of Scanning Probes
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    Chapter 6 Scanning Conductive Torsion Mode Microscopy
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    Chapter 7 Field Ion and Field Desorption Microscopy: Principles and Applications
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    Chapter 8 Noncontact Atomic Force Microscopy for Atomic-Scale Characterization of Material Surfaces
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    Chapter 9 Applications of Synchrotron-Based X-Ray Photoelectron Spectroscopy in the Characterization of Nanomaterials
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    Chapter 10 Exploration into the Valence Band Structures of Organic Semiconductors by Angle-Resolved Photoelectron Spectroscopy
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    Chapter 11 Band Bending at Metal-Semiconductor Interfaces, Ferroelectric Surfaces and Metal-Ferroelectric Interfaces Investigated by Photoelectron Spectroscopy
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    Chapter 12 Higher Resolution Scanning Probe Methods for Magnetic Imaging
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    Chapter 13 Imaging and Characterization of Magnetic Micro- and Nanostructures Using Force Microscopy
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    Chapter 14 Combining Micromanipulation, Kerr Magnetometry and Magnetic Force Microscopy for Characterization of Three-Dimensional Magnetic Nanostructures
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    Chapter 15 High Resolution STM Imaging
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    Chapter 16 Numerical and Finite Element Simulations of Nanotips for FIM/FEM
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