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Surface Science Tools for Nanomaterials Characterization

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Cover of 'Surface Science Tools for Nanomaterials Characterization'

Table of Contents

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    Book Overview
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    Chapter 1 Scanning Electrochemical Potential Microscopy (SECPM) and Electrochemical STM (EC-STM)
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    Chapter 2 Recovering Time-Resolved Imaging Forces in Solution by Scanning Probe Acceleration Microscopy: Theory and Application
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    Chapter 3 Scanning Probe Microscopy for Nanolithography
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    Chapter 4 Kelvin Probe Force Microscopy in Nanoscience and Nanotechnology
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    Chapter 5 Field Ion Microscopy for the Characterization of Scanning Probes
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    Chapter 6 Scanning Conductive Torsion Mode Microscopy
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    Chapter 7 Field Ion and Field Desorption Microscopy: Principles and Applications
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    Chapter 8 Noncontact Atomic Force Microscopy for Atomic-Scale Characterization of Material Surfaces
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    Chapter 9 Applications of Synchrotron-Based X-Ray Photoelectron Spectroscopy in the Characterization of Nanomaterials
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    Chapter 10 Exploration into the Valence Band Structures of Organic Semiconductors by Angle-Resolved Photoelectron Spectroscopy
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    Chapter 11 Band Bending at Metal-Semiconductor Interfaces, Ferroelectric Surfaces and Metal-Ferroelectric Interfaces Investigated by Photoelectron Spectroscopy
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    Chapter 12 Higher Resolution Scanning Probe Methods for Magnetic Imaging
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    Chapter 13 Imaging and Characterization of Magnetic Micro- and Nanostructures Using Force Microscopy
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    Chapter 14 Combining Micromanipulation, Kerr Magnetometry and Magnetic Force Microscopy for Characterization of Three-Dimensional Magnetic Nanostructures
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    Chapter 15 High Resolution STM Imaging
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    Chapter 16 Numerical and Finite Element Simulations of Nanotips for FIM/FEM
Attention for Chapter 8: Noncontact Atomic Force Microscopy for Atomic-Scale Characterization of Material Surfaces
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Chapter title
Noncontact Atomic Force Microscopy for Atomic-Scale Characterization of Material Surfaces
Chapter number 8
Book title
Surface Science Tools for Nanomaterials Characterization
Published by
Springer Berlin Heidelberg, February 2016
DOI 10.1007/978-3-662-44551-8_8
Book ISBNs
978-3-66-244550-1, 978-3-66-244551-8
Authors

Mehmet Z. Baykara, Baykara, Mehmet Z.

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X Demographics

The data shown below were collected from the profiles of 2 X users who shared this research output. Click here to find out more about how the information was compiled.
Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 11 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 11 100%

Demographic breakdown

Readers by professional status Count As %
Researcher 2 18%
Student > Ph. D. Student 1 9%
Unspecified 1 9%
Student > Postgraduate 1 9%
Other 1 9%
Other 0 0%
Unknown 5 45%
Readers by discipline Count As %
Materials Science 2 18%
Unspecified 1 9%
Physics and Astronomy 1 9%
Chemistry 1 9%
Unknown 6 55%