Catalan
Materials and Reliability Handbook for Semiconductor Optical and Electron Devices
Overview of attention for book
Table of Contents
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Altmetric BadgeBook Overview
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Altmetric BadgeChapter 1 Reliability Testing of Semiconductor Optical Devices
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Altmetric BadgeChapter 2 Failure Analysis of Semiconductor Optical Devices
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Altmetric BadgeChapter 3 Failure Analysis Using Optical Evaluation Technique (OBIC) of LDs and APDs for Fiber Optical Communication
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Altmetric BadgeChapter 4 Reliability and Degradation of III-V Optical Devices Focusing on Gradual Degradation
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Altmetric BadgeChapter 5 Catastrophic Optical Damage in High-Power, Broad-Area Laser Diodes
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Altmetric BadgeChapter 6 Reliability and Degradation of Vertical-Cavity Surface-Emitting Lasers
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Altmetric BadgeChapter 7 Structural Defects in GaN-Based Materials and Their Relation to GaN-Based Laser Diodes
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Altmetric BadgeChapter 8 InGaN Laser Diode Degradation
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Altmetric BadgeChapter 9 Radiation-Enhanced Dislocation Glide: The Current Status of Research
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Altmetric BadgeChapter 10 Mechanism of Defect Reactions in Semiconductors
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Altmetric BadgeChapter 11 Reliability Studies in the Real World
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Altmetric BadgeChapter 12 Strain Effects in AlGaN/GaN HEMTs
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Altmetric BadgeChapter 13 Reliability Issues in AlGaN/GaN High Electron Mobility Transistors
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Altmetric BadgeChapter 14 GaAs Device Reliability: High Electron Mobility Transistors and Heterojunction Bipolar Transistors
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Altmetric BadgeChapter 15 Novel Dielectrics for GaN Device Passivation and Improved Reliability
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Altmetric BadgeChapter 16 Reliability Simulation
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Altmetric BadgeChapter 17 The Analysis of Wide Band Gap Semiconductors Using Raman Spectroscopy
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Altmetric BadgeChapter 18 Reliability Study of InP-Based HBTs Operating at High Current Density
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