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Materials and Reliability Handbook for Semiconductor Optical and Electron Devices

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Cover of 'Materials and Reliability Handbook for Semiconductor Optical and Electron Devices'

Table of Contents

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    Book Overview
  2. Altmetric Badge
    Chapter 1 Reliability Testing of Semiconductor Optical Devices
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    Chapter 2 Failure Analysis of Semiconductor Optical Devices
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    Chapter 3 Failure Analysis Using Optical Evaluation Technique (OBIC) of LDs and APDs for Fiber Optical Communication
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    Chapter 4 Reliability and Degradation of III-V Optical Devices Focusing on Gradual Degradation
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    Chapter 5 Catastrophic Optical Damage in High-Power, Broad-Area Laser Diodes
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    Chapter 6 Reliability and Degradation of Vertical-Cavity Surface-Emitting Lasers
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    Chapter 7 Structural Defects in GaN-Based Materials and Their Relation to GaN-Based Laser Diodes
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    Chapter 8 InGaN Laser Diode Degradation
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    Chapter 9 Radiation-Enhanced Dislocation Glide: The Current Status of Research
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    Chapter 10 Mechanism of Defect Reactions in Semiconductors
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    Chapter 11 Reliability Studies in the Real World
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    Chapter 12 Strain Effects in AlGaN/GaN HEMTs
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    Chapter 13 Reliability Issues in AlGaN/GaN High Electron Mobility Transistors
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    Chapter 14 GaAs Device Reliability: High Electron Mobility Transistors and Heterojunction Bipolar Transistors
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    Chapter 15 Novel Dielectrics for GaN Device Passivation and Improved Reliability
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    Chapter 16 Reliability Simulation
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    Chapter 17 The Analysis of Wide Band Gap Semiconductors Using Raman Spectroscopy
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    Chapter 18 Reliability Study of InP-Based HBTs Operating at High Current Density
Attention for Chapter 12: Strain Effects in AlGaN/GaN HEMTs
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Chapter title
Strain Effects in AlGaN/GaN HEMTs
Chapter number 12
Book title
Materials and Reliability Handbook for Semiconductor Optical and Electron Devices
Published in
ADS, January 2013
DOI 10.1007/978-1-4614-4337-7_12
Book ISBNs
978-1-4614-4336-0, 978-1-4614-4337-7
Authors

Min Chu, Andrew D. Koehler, Amit Gupta, Srivatsan Parthasarathy, Mehmet Onur Baykan, Scott E. Thompson, Toshikazu Nishida

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 7 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 7 100%

Demographic breakdown

Readers by professional status Count As %
Researcher 2 29%
Student > Master 2 29%
Professor 1 14%
Student > Doctoral Student 1 14%
Student > Ph. D. Student 1 14%
Other 0 0%
Readers by discipline Count As %
Engineering 6 86%
Physics and Astronomy 1 14%