Investigation on Traps Dynamics & Negative Bias Stress in D-Mode GaN-on-Si Power MIS HEMTs Under High-Temperature
Article in IEEE Transactions on Device and Materials Reliability (July 2024)
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Article in IEEE Transactions on Device and Materials Reliability (July 2024)
Article in Measurement (April 2024)
Article in IEEE Transactions on Device and Materials Reliability (February 2024)