Silicon Devices and Process Integration

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So far, Dimensions has found 9 publications that cite this research output.

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Photoconductivity: Fundamental Concepts

Book chapter (June 2022)

Peculiarities of changes in the structure and electrophysical characteristics of n-Si under the effect of various thermal treatment regimes

Article in Reports of the National Academy of Sciences of Ukraine (June 2020)

Synergistic passivation effects of nitrogen plasma and oxygen plasma on improving the interface quality and bias temperature instability of 4H-SiC MOS capacitors

Article in Applied Surface Science (May 2020)

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