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BAT: The Bit-Level Analysis Tool
Computer Aided Verification
Springer, Berlin, Heidelberg, July 2007
Panagiotis Manolios, Sudarshan K. Srinivasan, Daron Vroon, Manolios, Panagiotis, Srinivasan, Sudarshan K., Vroon, Daron
The data shown below were compiled from readership statistics for 1 Mendeley reader of this research output. Click here to see the associated Mendeley record.
|Readers by professional status||Count||As %|
|Student > Ph. D. Student||1||100%|
|Readers by discipline||Count||As %|