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Infrared Ellipsometry on Semiconductor Layer Structures

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Cover of 'Infrared Ellipsometry on Semiconductor Layer Structures'

Table of Contents

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    Book Overview
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    Chapter 1 Introduction
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    Chapter 2 Ellipsometry
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    Chapter 3 Infrared Model Dielectric Functions
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    Chapter 4 Polaritons in Semiconductor Layer Structures
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    Chapter 5 Anisotropic Substrates
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    Chapter 6 Zincblende-Structure Materials (III–V)
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    Chapter 7 Wurtzite-Structure Materials (Group-III Nitrides, ZnO)
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    Chapter 8 Magneto-Optic Ellipsometry
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    Chapter 9 4×4 Transfer Matrix T p for Isotropic Films
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    Chapter 10 4 × 4 Transfer Matrix T p for Dielectric Homogeneous Films
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    Chapter 11 4 × 4 Transfer Matrix T p for Magneto-optic Films
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    Chapter 12 4 × 4 Transfer Matrix T p for Dielectric Helical Films
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    Chapter 13 TM Waves at the Interface Between Two Half-Infinite Media
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    Chapter 14 TM Waves at Two Stratified Interfaces
Attention for Chapter 7: Wurtzite-Structure Materials (Group-III Nitrides, ZnO)
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