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Mendeley readers
| Title |
Infrared Ellipsometry on Semiconductor Layer Structures
|
|---|---|
| Published by |
Springer Berlin Heidelberg, March 2005
|
| DOI | 10.1007/b11964 |
| ISBNs |
978-3-54-023249-0, 978-3-54-044701-6
|
| Authors |
Schubert, Mathias |
Mendeley readers
The data shown below were compiled from readership statistics for 65 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| Germany | 1 | 2% |
| Norway | 1 | 2% |
| Canada | 1 | 2% |
| Unknown | 62 | 95% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Student > Ph. D. Student | 15 | 23% |
| Researcher | 10 | 15% |
| Professor > Associate Professor | 4 | 6% |
| Student > Master | 2 | 3% |
| Professor | 2 | 3% |
| Other | 5 | 8% |
| Unknown | 27 | 42% |
| Readers by discipline | Count | As % |
|---|---|---|
| Physics and Astronomy | 25 | 38% |
| Materials Science | 5 | 8% |
| Engineering | 3 | 5% |
| Unspecified | 2 | 3% |
| Chemistry | 2 | 3% |
| Other | 1 | 2% |
| Unknown | 27 | 42% |