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Timeline
Chapter title |
Techniques of Interference Reduction in Probe System for Wafer Level Noise Measurements of Submicron Semiconductor Devices
|
---|---|
Chapter number | 35 |
Book title |
Advanced Experimental Methods For Noise Research in Nanoscale Electronic Devices
|
Published by |
Springer, Dordrecht, January 2004
|
DOI | 10.1007/1-4020-2170-4_35 |
Book ISBNs |
978-1-4020-2169-5, 978-1-4020-2170-1
|
Authors |
L. Spiralski, A. Szewczyk, L. Hasse, Spiralski, L., Szewczyk, A., Hasse, L. |