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Advanced Experimental Methods For Noise Research in Nanoscale Electronic Devices

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Cover of 'Advanced Experimental Methods For Noise Research in Nanoscale Electronic Devices'

Table of Contents

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    Book Overview
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    Chapter 1 1 /f Noise Sources
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    Chapter 2 Noise Sources in GaN/AlGaN Quantum Wells and Devices
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    Chapter 3 1 /f Noise in Nanomaterials and Nanostructurea: Old Questions in a New Fashion
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    Chapter 4 1 /f Spectra as a Consequence of the Randomness of Variance
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    Chapter 5 Quantum Phase Locking, 1 /f Noise and Entanglement
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    Chapter 6 Shot Noise in Mesoscopic Devices and Quantum Dot Networks
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    Chapter 7 Super-Poissonian Noise in Nanostructures
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    Chapter 8 Stochastic and Deterministic Models of Noise
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    Chapter 9 Noise in Optoelectronic Devices
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    Chapter 10 Fluctuations of Optical and Electrical Parameters and Their Correlation of Multiple-Quantum-Well INGAAS/INP Lasers
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    Chapter 11 Microwave Noise and Fast/Ultrafast Electronic Processes in Nitride 2DEG Channels
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    Chapter 12 Noise of High Temperature Superconducting Bolometers
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    Chapter 13 1/ f Noise in MOSTs: Faster is Noisier
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    Chapter 14 Experimental Assessment of Quantum Effects in the Low-Frequency Noise and RTS of Deep Submicron MOSFETs
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    Chapter 15 Noise and Tunneling Through the 2.5 nm Gate Oxide in Soi MOSFETs
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    Chapter 16 Low Frequency Noise Studies of Si Nano-Crystal Effects in MOS Transistors and Capacitors
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    Chapter 17 Noise Modelling in Low Dimensional Electronic Structures
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    Chapter 18 Correlation Noise Measurements and Modeling of Nanoscale MOSFETs
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    Chapter 19 Tunneling Effects and Low Frequency Noise of GaN/GaAlN HFETs
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    Chapter 20 High Frequency Noise Sources Extraction in Nanometique MOSFETs
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    Chapter 21 Iiformative “Passport Data” of Surface Nano- and Mocrostrucures
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    Chapter 22 Noise Measurement Technique
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    Chapter 23 Techniques for High-Sensitivity Measurements of Shot Noise in Nanostructures
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    Chapter 24 Correlation Spectrum Analyzer: Pringiples and Limits in Noise Measurements
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    Chapter 25 Measurement and Analysis Methods for Random Telegraph Signals
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    Chapter 26 RTS in Quantum Dots and MOSFETs: Experimental Set-Up with Long-Time Stability and Magnetic Field Compensation
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    Chapter 27 Some Considerations for the Construction of Low-Noise Amplifiers in Very Low Frequency Region
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    Chapter 28 Measurements of Low Frequency Noise in Nano-Grained RuO 2 +Glass Films Below 1 K
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    Chapter 29 Technique for Investigation of Non-Gaussian and Non-Stationary Properties of LF Noise in Nanoscale Semiconductor Devices
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    Chapter 30 The Noise Background Suppression of Noise Measuring Set-UP
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    Chapter 31 Accuracy of Noise Measurements for 1/ f and GR Noise
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    Chapter 32 Radiofrequency and Microwave Noise Metrology
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    Chapter 33 Treatment of Noise Data in Laplace Plane
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    Chapter 34 Measurement of Noise Parameter Set in the Low Frequency Range: Requirements and Instrumentation
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    Chapter 35 Techniques of Interference Reduction in Probe System for Wafer Level Noise Measurements of Submicron Semiconductor Devices
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    Chapter 36 Hooge Mobility Fluctuations in n-InSb Magnetoresistors As a Reference for Access Resistance LF-Noise Measurements of SiGe Metamorphic HMOS FETs
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    Chapter 37 Optimised Preamplifier for LF-Noise MOSFET Characterization
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    Chapter 38 Net of YBCO and LSMO Thermometers for Bolometric Applications
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    Chapter 39 Diagnostics of GaAs Light Emitting Diode pn Junctions
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    Chapter 40 New Tools For Fast And Senstive Noise Measurements
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    Chapter 41 Using a Novel, Computer Controlled Automatic System for LF Noise Measurements Under Point Probes
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Title
Advanced Experimental Methods For Noise Research in Nanoscale Electronic Devices
Published by
Springer Netherlands, February 2006
DOI 10.1007/1-4020-2170-4
ISBNs
978-1-4020-2169-5, 978-1-4020-2170-1
Editors

Sikula, Josef, Levinshtein, Michael

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The data shown below were compiled from readership statistics for 10 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Portugal 2 20%
India 1 10%
Spain 1 10%
Germany 1 10%
Italy 1 10%
United Kingdom 1 10%
United States 1 10%
Unknown 2 20%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 29 290%
Researcher 21 210%
Student > Bachelor 7 70%
Student > Master 5 50%
Other 5 50%
Other 15 150%
Readers by discipline Count As %
Physics and Astronomy 26 260%
Engineering 23 230%
Chemistry 9 90%
Materials Science 9 90%
Agricultural and Biological Sciences 4 40%
Other 11 110%