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Timeline
Mendeley readers
Chapter title |
Noise and Tunneling Through the 2.5 nm Gate Oxide in Soi MOSFETs
|
---|---|
Chapter number | 15 |
Book title |
Advanced Experimental Methods For Noise Research in Nanoscale Electronic Devices
|
Published by |
Springer, Dordrecht, January 2004
|
DOI | 10.1007/1-4020-2170-4_15 |
Book ISBNs |
978-1-4020-2169-5, 978-1-4020-2170-1
|
Authors |
N. Lukyanchikova, E. Simoen, A. Mercha, C. Claeys, Lukyanchikova, N., Simoen, E., Mercha, A., Claeys, C. |
Mendeley readers
The data shown below were compiled from readership statistics for 3 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
Unknown | 3 | 100% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Researcher | 2 | 67% |
Student > Bachelor | 1 | 33% |
Readers by discipline | Count | As % |
---|---|---|
Computer Science | 1 | 33% |
Physics and Astronomy | 1 | 33% |
Materials Science | 1 | 33% |