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Chapter title |
On the Design of Robust Multiple Fault Testable CMOS Combinational Logic Circuits
|
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Chapter number | 46 |
Book title |
The Best of ICCAD
|
Published by |
Springer, Boston, MA, January 2003
|
DOI | 10.1007/978-1-4615-0292-0_46 |
Book ISBNs |
978-1-4613-5007-1, 978-1-4615-0292-0
|
Authors |
Sandip Kundu, Sudhakar M. Reddy, Niraj K. Jha, Kundu, Sandip, Reddy, Sudhakar M., Jha, Niraj K. |