On-Chip Power Supply Noise Measurement using Time Resolved Emission (TRE) Waveforms of Light Emission from Off-State Leakage Current (LEOSLC)
Conference proceeding (November 2009)
The most recent citing publications are shown below. View all 3 publications that cite this research output on Dimensions.
On-chip /spl Delta/I noise in the power distribution networks of high speed CMOS integrated circuits
Conference proceeding (January 2000)
Delay uncertainty due to on-chip simultaneous switching noise in high performance CMOS integrated circuits
Conference proceeding in 2010 IEEE Workshop On Signal Processing Systems (January 2000)