You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output.
Click here to find out more.
| Chapter title |
Characterization of a Sub-electron Readout Noise VGA Imager in a Standard CIS Process
|
|---|---|
| Chapter number | 7 |
| Book title |
Ultra Low Noise CMOS Image Sensors
|
| Published by |
Springer, Cham, January 2018
|
| DOI | 10.1007/978-3-319-68774-2_7 |
| Book ISBNs |
978-3-31-968773-5, 978-3-31-968774-2
|
| Authors |
Assim Boukhayma |