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| Chapter title |
Design of a Sub-electron Readout Noise Pixel in a Standard CIS Process
|
|---|---|
| Chapter number | 6 |
| Book title |
Ultra Low Noise CMOS Image Sensors
|
| Published by |
Springer, Cham, January 2018
|
| DOI | 10.1007/978-3-319-68774-2_6 |
| Book ISBNs |
978-3-31-968773-5, 978-3-31-968774-2
|
| Authors |
Assim Boukhayma |