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Chapter title |
A Chip Defect Detection System Based on Machine Vision
|
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Chapter number | 45 |
Book title |
Proceedings of IncoME-VI and TEPEN 2021
|
Published by |
Springer, Cham, January 2023
|
DOI | 10.1007/978-3-030-99075-6_45 |
Book ISBNs |
978-3-03-099074-9, 978-3-03-099075-6
|
Authors |
Qiao, Xindan, Chen, Ting, Zhuang, Wanjing, Wu, Jinyi |