Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM
Springer Science+Business Media
Chapter title |
Recent Developments
|
---|---|
Chapter number | 7 |
Book title |
Physical Principles of Electron Microscopy
|
Published by |
Springer, Boston, MA, January 2005
|
DOI | 10.1007/0-387-26016-1_7 |
Book ISBNs |
978-0-387-25800-3, 978-0-387-26016-7
|
Authors |
Ray F. Egerton, Egerton, Ray F. |
Country | Count | As % |
---|---|---|
United Kingdom | 1 | 14% |
Unknown | 6 | 86% |
Readers by professional status | Count | As % |
---|---|---|
Student > Master | 3 | 43% |
Student > Bachelor | 2 | 29% |
Student > Ph. D. Student | 2 | 29% |
Unspecified | 1 | 14% |
Readers by discipline | Count | As % |
---|---|---|
Unspecified | 2 | 29% |
Biochemistry, Genetics and Molecular Biology | 2 | 29% |
Chemical Engineering | 1 | 14% |
Physics and Astronomy | 1 | 14% |
Materials Science | 1 | 14% |
Other | 1 | 14% |