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Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM

Overview of attention for book
Overall attention for this book and its chapters
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Mentioned by

syllabi
1 institution with syllabi
patent
1 patent
wikipedia
2 Wikipedia pages

Readers on

mendeley
549 Mendeley
citeulike
1 CiteULike
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Title
Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM
Published by
Springer Science+Business Media, January 2007
DOI 10.1007/b136495
ISBNs
978-0-387-25800-3, 978-0-387-26016-7
Authors

Egerton, R. F, Egerton, Ray F.

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 549 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Colombia 1 <1%
Malaysia 1 <1%
Norway 1 <1%
Brazil 1 <1%
South Africa 1 <1%
Czechia 1 <1%
United Kingdom 1 <1%
Canada 1 <1%
Slovenia 1 <1%
Other 2 <1%
Unknown 538 98%

Demographic breakdown

Readers by professional status Count As %
Student > Ph. D. Student 73 13%
Student > Master 69 13%
Student > Bachelor 42 8%
Researcher 22 4%
Student > Doctoral Student 16 3%
Other 27 5%
Unknown 300 55%
Readers by discipline Count As %
Materials Science 54 10%
Chemistry 54 10%
Engineering 52 9%
Physics and Astronomy 21 4%
Biochemistry, Genetics and Molecular Biology 17 3%
Other 41 7%
Unknown 310 56%