↓ Skip to main content
What is this page? Embed badge

Optical and Electronic Process of Nano-Matters

Overview of attention for book
Cover of 'Optical and Electronic Process of Nano-Matters'

Table of Contents

  1. Altmetric Badge
    Book Overview
  2. Altmetric Badge
    Chapter 1 Electronic and Electromagnetic Properties in Nanometer Scales
  3. Altmetric Badge
    Chapter 2 Electron Transport in Semiconductor Quantum Dots
  4. Altmetric Badge
    Chapter 3 Electron Energy Modulation with Optical Evanescent Waves
  5. Altmetric Badge
    Chapter 4 Interactions of Electrons and Electromagnetic Fields in a Single Molecule
  6. Altmetric Badge
    Chapter 5 Theory of Electronic and Atomic Processes in Scanning Probe Microscopy
  7. Altmetric Badge
    Chapter 6 Tunneling-Electron Luminescence Microscopy for Multifunctional and Real-Space Characterization of Semiconductor Nanostructures
  8. Altmetric Badge
    Chapter 7 Near-Field Optical Spectroscopy of Single Quantum Dots
  9. Altmetric Badge
    Chapter 8 Chemical Vapor Deposition of Nanometric Materials by Optical Near-Fields: Toward Nano-Photonic Integration
  10. Altmetric Badge
    Chapter 9 Noncontact Atomic Force Microscopy
  11. Altmetric Badge
    Chapter 10 Correlation between Interface States and Structures Deduced from Atomic-Scale Surface Roughness in Ultrathin SiO 2 /Si System
  12. Altmetric Badge
    Chapter 11 Characterization of Molecular Films by a Scanning Probe Microscope
Attention for Chapter 11: Characterization of Molecular Films by a Scanning Probe Microscope
Altmetric Badge

Citations

dimensions_citation
5 Dimensions
Summary Dimensions citations
You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output. Click here to find out more.
Chapter title
Characterization of Molecular Films by a Scanning Probe Microscope
Chapter number 11
Book title
Optical and Electronic Process of Nano-Matters
Published by
Springer, Dordrecht, January 2001
DOI 10.1007/978-94-017-2482-1_11
Book ISBNs
978-9-04-815707-5, 978-9-40-172482-1
Authors

M. Hara, K. Kudo

View on publisher site

This page is provided by Altmetric.