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| Chapter title |
Correlation between Interface States and Structures Deduced from Atomic-Scale Surface Roughness in Ultrathin SiO 2 /Si System
|
|---|---|
| Chapter number | 10 |
| Book title |
Optical and Electronic Process of Nano-Matters
|
| Published by |
Springer, Dordrecht, January 2001
|
| DOI | 10.1007/978-94-017-2482-1_10 |
| Book ISBNs |
978-9-04-815707-5, 978-9-40-172482-1
|
| Authors |
T. Hattori, H. Nohira, K. Takahashi |