Characterization of single 1.8-nm Au nanoparticle attachments on AFM tips for single sub-4-nm object pickup

Overview of attention for article published in Discover Nano, November 2013

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So far, Altmetric has seen 2 patents that reference this research output.

SYSTEM FOR SCANNING PROBE MICROSCOPY APPLICATIONS AND METHOD FOR OBTAINING SAID SYSTEM

Application WO-2020053358-A1

World Intellectual Property Organisation (WIPO)

SYSTEM FOR SCANNING PROBE MICROSCOPY APPLICATIONS AND METHOD FOR OBTAINING SAID SYSTEM

Application EP-3623821-A1

European Patent Office

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