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Mendeley readers
| Chapter title |
Metrology for Microsystems Manufacturing
|
|---|---|
| Chapter number | 5 |
| Book title |
Process Variations in Microsystems Manufacturing
|
| Published by |
Springer, Cham, January 2020
|
| DOI | 10.1007/978-3-030-40560-1_5 |
| Book ISBNs |
978-3-03-040558-8, 978-3-03-040560-1
|
| Authors |
Michael Huff |
Mendeley readers
The data shown below were compiled from readership statistics for 2 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| Unknown | 2 | 100% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Unspecified | 1 | 50% |
| Lecturer | 1 | 50% |
| Readers by discipline | Count | As % |
|---|---|---|
| Unspecified | 1 | 50% |
| Engineering | 1 | 50% |