You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output.
Click here to find out more.
| Chapter title |
An Evaluation of Single Event Effects by Heavy Ion Irradiation on Atom Switch ROM/FPGA
|
|---|---|
| Chapter number | 4 |
| Book title |
Atomic Switch
|
| Published by |
Springer, Cham, March 2020
|
| DOI | 10.1007/978-3-030-34875-5_4 |
| Book ISBNs |
978-3-03-034874-8, 978-3-03-034875-5
|
| Authors |
K. Takeuchi, M. Tada, T. Sakamoto, S. Kuboyama |