You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output.
Click here to find out more.
| Chapter title |
Low-Temperature Scanning Electron Microscopy
|
|---|---|
| Chapter number | 10 |
| Book title |
Low-Temperature Microscopy and Analysis
|
| Published by |
Springer US, January 1992
|
| DOI | 10.1007/978-1-4899-2302-8_10 |
| Book ISBNs |
978-1-4899-2304-2, 978-1-4899-2302-8
|
| Authors |
Patrick Echlin |