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Si Detectors and Characterization for HEP and Photon Science Experiment

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Attention for Chapter 6: Development of Radiation Hard p + n Si Pixel Sensors for the European XFEL
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Chapter title
Development of Radiation Hard p + n Si Pixel Sensors for the European XFEL
Chapter number 6
Book title
Si Detectors and Characterization for HEP and Photon Science Experiment
Published by
Springer, Cham, January 2019
DOI 10.1007/978-3-030-19531-1_6
Book ISBNs
978-3-03-019530-4, 978-3-03-019531-1
Authors

Ajay Kumar Srivastava