↓ Skip to main content

Nanotechnology Standards

Overview of attention for book
Attention for Chapter 6: Current Standardization Activities of Measurement and Characterization for Industrial Applications
Altmetric Badge

Citations

dimensions_citation
39 Dimensions
You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output. Click here to find out more.
Chapter title
Current Standardization Activities of Measurement and Characterization for Industrial Applications
Chapter number 6
Book title
Nanotechnology Standards
Published by
Springer, New York, NY, January 2011
DOI 10.1007/978-1-4419-7853-0_6
Book ISBNs
978-1-4419-7852-3, 978-1-4419-7853-0
Authors

Shingo Ichimura, Hidehiko Nonaka, Ichimura, Shingo, Nonaka, Hidehiko