You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output.
Click here to find out more.
Chapter title |
Defects Driven Yield and Reliability Modeling for Semiconductor Manufacturing
|
---|---|
Chapter number | 16 |
Book title |
Statistical Quality Technologies
|
Published by |
Springer, Cham, January 2019
|
DOI | 10.1007/978-3-030-20709-0_16 |
Book ISBNs |
978-3-03-020708-3, 978-3-03-020709-0
|
Authors |
Tao Yuan, Suk Joo Bae, Yue Kuo, Yuan, Tao, Bae, Suk Joo, Kuo, Yue |