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X Demographics
Mendeley readers
| Chapter title |
Optical Scatterometry for Nanostructure Metrology
|
|---|---|
| Chapter number | 17 |
| Book title |
Metrology
|
| Published by |
Springer, Singapore, January 2019
|
| DOI | 10.1007/978-981-10-4938-5_17 |
| Book ISBNs |
978-9-81-104937-8, 978-9-81-104938-5
|
| Authors |
Xiuguo Chen, Shiyuan Liu, Chen, Xiuguo, Liu, Shiyuan |
X Demographics
The data shown below were collected from the profiles of 2 X users who shared this research output. Click here to find out more about how the information was compiled.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| United Kingdom | 1 | 50% |
| United States | 1 | 50% |
Demographic breakdown
| Type | Count | As % |
|---|---|---|
| Members of the public | 2 | 100% |
Mendeley readers
The data shown below were compiled from readership statistics for 5 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| Unknown | 5 | 100% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Professor > Associate Professor | 1 | 20% |
| Student > Doctoral Student | 1 | 20% |
| Student > Master | 1 | 20% |
| Unknown | 2 | 40% |
| Readers by discipline | Count | As % |
|---|---|---|
| Engineering | 2 | 40% |
| Physics and Astronomy | 1 | 20% |
| Unknown | 2 | 40% |