Metrology
Springer Singapore
Chapter title |
A Showcase of the Use of Autoencoders in Feature Learning Applications
|
---|---|
Chapter number | 40 |
Book title |
Metrology
|
Published in |
arXiv, May 2019
|
DOI | 10.1007/978-3-030-19651-6_40 |
Book ISBNs |
978-9-81-104912-5, 978-3-03-019650-9, 978-3-03-019651-6
|
Authors |
David Charte, Francisco Charte, María J. del Jesus, Francisco Herrera, Charte, David, Charte, Francisco, del Jesus, María J., Herrera, Francisco |
Country | Count | As % |
---|---|---|
United Kingdom | 1 | 20% |
Unknown | 4 | 80% |
Type | Count | As % |
---|---|---|
Members of the public | 5 | 100% |
Country | Count | As % |
---|---|---|
Unknown | 16 | 100% |
Readers by professional status | Count | As % |
---|---|---|
Researcher | 3 | 19% |
Professor > Associate Professor | 2 | 13% |
Student > Ph. D. Student | 2 | 13% |
Professor | 1 | 6% |
Student > Bachelor | 1 | 6% |
Other | 2 | 13% |
Unknown | 5 | 31% |
Readers by discipline | Count | As % |
---|---|---|
Computer Science | 4 | 25% |
Mathematics | 1 | 6% |
Decision Sciences | 1 | 6% |
Medicine and Dentistry | 1 | 6% |
Unknown | 9 | 56% |