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Measurement Techniques and Practices of Colloid and Interface Phenomena

Overview of attention for book
Attention for Chapter 8: Atomic Force Microscope (AFM)
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Citations

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Readers on

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134 Mendeley
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Chapter title
Atomic Force Microscope (AFM)
Chapter number 8
Book title
Measurement Techniques and Practices of Colloid and Interface Phenomena
Published by
Springer, Singapore, January 2019
DOI 10.1007/978-981-13-5931-6_8
Book ISBNs
978-9-81-135930-9, 978-9-81-135931-6
Authors

Kenichi Sakai, Sakai, Kenichi

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 134 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Poland 1 <1%
Unknown 133 99%

Demographic breakdown

Readers by professional status Count As %
Student > Master 21 16%
Student > Ph. D. Student 20 15%
Researcher 12 9%
Student > Bachelor 11 8%
Student > Doctoral Student 8 6%
Other 17 13%
Unknown 45 34%
Readers by discipline Count As %
Engineering 17 13%
Biochemistry, Genetics and Molecular Biology 13 10%
Physics and Astronomy 12 9%
Materials Science 12 9%
Chemistry 8 6%
Other 22 16%
Unknown 50 37%