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Timeline
Mendeley readers
Chapter title |
Introduction to VLSI Testing
|
---|---|
Chapter number | 1 |
Book title |
Test and Diagnosis for Small-Delay Defects
|
Published by |
Springer, New York, NY, January 2012
|
DOI | 10.1007/978-1-4419-8297-1_1 |
Book ISBNs |
978-1-4419-8296-4, 978-1-4419-8297-1
|
Authors |
Tehranipoor, Mohammad, Peng, Ke, Chakrabarty, Krishnendu, Mohammad Tehranipoor, Ke Peng, Krishnendu Chakrabarty |
Mendeley readers
The data shown below were compiled from readership statistics for 10 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
Unknown | 10 | 100% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Student > Ph. D. Student | 3 | 30% |
Student > Master | 2 | 20% |
Student > Doctoral Student | 1 | 10% |
Other | 1 | 10% |
Professor > Associate Professor | 1 | 10% |
Other | 1 | 10% |
Unknown | 1 | 10% |
Readers by discipline | Count | As % |
---|---|---|
Engineering | 8 | 80% |
Computer Science | 1 | 10% |
Unknown | 1 | 10% |