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Test and Diagnosis for Small-Delay Defects

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Cover of 'Test and Diagnosis for Small-Delay Defects'

Table of Contents

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    Book Overview
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    Chapter 1 Introduction to VLSI Testing
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    Chapter 2 Delay Test and Small-Delay Defects
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    Chapter 3 Long Path-Based Hybrid Method
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    Chapter 4 Process Variations- and Crosstalk-Aware Pattern Selection
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    Chapter 5 Power Supply Noise- and Crosstalk-Aware Hybrid Method
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    Chapter 6 SDD-Based Hybrid Method
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    Chapter 7 Maximizing Crosstalk Effect on Critical Paths
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    Chapter 8 Maximizing Power Supply Noise on Critical Paths
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    Chapter 9 Faster-Than-At-Speed Test
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    Chapter 10 Introduction to Diagnosis
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    Chapter 11 Diagnosing Noise-Induced SDDs by Using Dynamic SDF
Attention for Chapter 11: Diagnosing Noise-Induced SDDs by Using Dynamic SDF
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Summary
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Chapter title
Diagnosing Noise-Induced SDDs by Using Dynamic SDF
Chapter number 11
Book title
Test and Diagnosis for Small-Delay Defects
Published by
Springer, New York, NY, January 2011
DOI 10.1007/978-1-4419-8297-1_11
Book ISBNs
978-1-4419-8296-4, 978-1-4419-8297-1
Authors

Mohammad Tehranipoor, Ke Peng, Krishnendu Chakrabarty, Tehranipoor, Mohammad, Peng, Ke, Chakrabarty, Krishnendu

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