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Mendeley readers
Chapter title |
Constructing a Metrology Sampling Framework for In-line Inspection in Semiconductor Fabrication
|
---|---|
Chapter number | 10 |
Book title |
Advances in Production Management Systems. Smart Manufacturing for Industry 4.0
|
Published by |
Springer, Cham, August 2018
|
DOI | 10.1007/978-3-319-99707-0_10 |
Book ISBNs |
978-3-31-999706-3, 978-3-31-999707-0
|
Authors |
Chen-Fu Chien, Yun-Siang Lin, Yu-Shin Tan, Chien, Chen-Fu, Lin, Yun-Siang, Tan, Yu-Shin |
Mendeley readers
The data shown below were compiled from readership statistics for 7 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
Unknown | 7 | 100% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Student > Master | 2 | 29% |
Student > Bachelor | 1 | 14% |
Professor > Associate Professor | 1 | 14% |
Unknown | 3 | 43% |
Readers by discipline | Count | As % |
---|---|---|
Computer Science | 2 | 29% |
Engineering | 2 | 29% |
Unknown | 3 | 43% |