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Mendeley readers
Chapter title |
Quantification and Prediction of Damage in SAM Images of Semiconductor Devices
|
---|---|
Chapter number | 55 |
Book title |
Image Analysis and Recognition
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Published by |
Springer, Cham, June 2018
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DOI | 10.1007/978-3-319-93000-8_55 |
Book ISBNs |
978-3-31-992999-6, 978-3-31-993000-8
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Authors |
Dženana Alagić, Olivia Bluder, Jürgen Pilz |
Mendeley readers
The data shown below were compiled from readership statistics for 1 Mendeley reader of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
Country | Count | As % |
---|---|---|
Unknown | 1 | 100% |
Demographic breakdown
Readers by professional status | Count | As % |
---|---|---|
Professor | 1 | 100% |
Readers by discipline | Count | As % |
---|---|---|
Mathematics | 1 | 100% |