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Chapter title |
Advanced Instrumentation of Frequency Modulation AFM for Subnanometer-Scale 2D/3D Measurements at Solid-Liquid Interfaces
|
---|---|
Chapter number | 20 |
Book title |
Noncontact Atomic Force Microscopy
|
Published by |
Springer, Cham, January 2015
|
DOI | 10.1007/978-3-319-15588-3_20 |
Book ISBNs |
978-3-31-915587-6, 978-3-31-915588-3
|
Authors |
Takeshi Fukuma, Fukuma, Takeshi |