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Materials and Reliability Handbook for Semiconductor Optical and Electron Devices

Overview of attention for book
Cover of 'Materials and Reliability Handbook for Semiconductor Optical and Electron Devices'

Table of Contents

  1. Altmetric Badge
    Book Overview
  2. Altmetric Badge
    Chapter 1 Reliability Testing of Semiconductor Optical Devices
  3. Altmetric Badge
    Chapter 2 Failure Analysis of Semiconductor Optical Devices
  4. Altmetric Badge
    Chapter 3 Failure Analysis Using Optical Evaluation Technique (OBIC) of LDs and APDs for Fiber Optical Communication
  5. Altmetric Badge
    Chapter 4 Reliability and Degradation of III-V Optical Devices Focusing on Gradual Degradation
  6. Altmetric Badge
    Chapter 5 Catastrophic Optical Damage in High-Power, Broad-Area Laser Diodes
  7. Altmetric Badge
    Chapter 6 Reliability and Degradation of Vertical-Cavity Surface-Emitting Lasers
  8. Altmetric Badge
    Chapter 7 Structural Defects in GaN-Based Materials and Their Relation to GaN-Based Laser Diodes
  9. Altmetric Badge
    Chapter 8 InGaN Laser Diode Degradation
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    Chapter 9 Radiation-Enhanced Dislocation Glide: The Current Status of Research
  11. Altmetric Badge
    Chapter 10 Mechanism of Defect Reactions in Semiconductors
  12. Altmetric Badge
    Chapter 11 Reliability Studies in the Real World
  13. Altmetric Badge
    Chapter 12 Strain Effects in AlGaN/GaN HEMTs
  14. Altmetric Badge
    Chapter 13 Reliability Issues in AlGaN/GaN High Electron Mobility Transistors
  15. Altmetric Badge
    Chapter 14 GaAs Device Reliability: High Electron Mobility Transistors and Heterojunction Bipolar Transistors
  16. Altmetric Badge
    Chapter 15 Novel Dielectrics for GaN Device Passivation and Improved Reliability
  17. Altmetric Badge
    Chapter 16 Reliability Simulation
  18. Altmetric Badge
    Chapter 17 The Analysis of Wide Band Gap Semiconductors Using Raman Spectroscopy
  19. Altmetric Badge
    Chapter 18 Reliability Study of InP-Based HBTs Operating at High Current Density
Attention for Chapter 2: Failure Analysis of Semiconductor Optical Devices
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About this Attention Score

  • Good Attention Score compared to outputs of the same age (73rd percentile)
  • Good Attention Score compared to outputs of the same age and source (73rd percentile)

Mentioned by

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1 news outlet

Citations

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62 Dimensions

Readers on

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21 Mendeley
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Chapter title
Failure Analysis of Semiconductor Optical Devices
Chapter number 2
Book title
Materials and Reliability Handbook for Semiconductor Optical and Electron Devices
Published in
ADS, January 2013
DOI 10.1007/978-1-4614-4337-7_2
Book ISBNs
978-1-4614-4336-0, 978-1-4614-4337-7
Authors

Osamu Ueda, Robert W. Herrick

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 21 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 21 100%

Demographic breakdown

Readers by professional status Count As %
Student > Bachelor 5 24%
Student > Master 5 24%
Researcher 5 24%
Student > Ph. D. Student 1 5%
Unknown 5 24%
Readers by discipline Count As %
Engineering 11 52%
Materials Science 3 14%
Chemistry 1 5%
Agricultural and Biological Sciences 1 5%
Unknown 5 24%
Attention Score in Context

Attention Score in Context

This research output has an Altmetric Attention Score of 4. This is our high-level measure of the quality and quantity of online attention that it has received. This Attention Score, as well as the ranking and number of research outputs shown below, was calculated when the research output was last mentioned on 08 March 2024.
All research outputs
#7,385,395
of 25,452,734 outputs
Outputs from ADS
#6,228
of 26,051 outputs
Outputs of similar age
#72,875
of 289,365 outputs
Outputs of similar age from ADS
#127
of 533 outputs
Altmetric has tracked 25,452,734 research outputs across all sources so far. This one has received more attention than most of these and is in the 69th percentile.
So far Altmetric has tracked 26,051 research outputs from this source. They typically receive a little more attention than average, with a mean Attention Score of 5.1. This one has gotten more attention than average, scoring higher than 74% of its peers.
Older research outputs will score higher simply because they've had more time to accumulate mentions. To account for age we can compare this Altmetric Attention Score to the 289,365 tracked outputs that were published within six weeks on either side of this one in any source. This one has gotten more attention than average, scoring higher than 73% of its contemporaries.
We're also able to compare this research output to 533 others from the same source and published within six weeks on either side of this one. This one has gotten more attention than average, scoring higher than 73% of its contemporaries.