Materials and Reliability Handbook for Semiconductor Optical and Electron Devices
Springer New York
Chapter title |
Reliability and Degradation of III-V Optical Devices Focusing on Gradual Degradation
|
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Chapter number | 4 |
Book title |
Materials and Reliability Handbook for Semiconductor Optical and Electron Devices
|
Published in |
ADS, January 2013
|
DOI | 10.1007/978-1-4614-4337-7_4 |
Book ISBNs |
978-1-4614-4336-0, 978-1-4614-4337-7
|
Authors |
Osamu Ueda |
Country | Count | As % |
---|---|---|
Unknown | 3 | 100% |
Readers by professional status | Count | As % |
---|---|---|
Researcher | 1 | 33% |
Student > Master | 1 | 33% |
Unknown | 1 | 33% |
Readers by discipline | Count | As % |
---|---|---|
Engineering | 2 | 67% |
Unknown | 1 | 33% |