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Mendeley readers
| Chapter title |
Reliability and Reliability Testing
|
|---|---|
| Chapter number | 12 |
| Book title |
Semiconductor Power Devices
|
| Published by |
Springer, Cham, January 2018
|
| DOI | 10.1007/978-3-319-70917-8_12 |
| Book ISBNs |
978-3-31-970916-1, 978-3-31-970917-8
|
| Authors |
Josef Lutz, Heinrich Schlangenotto, Uwe Scheuermann, Rik De Doncker, Lutz, Josef, Schlangenotto, Heinrich, Scheuermann, Uwe, De Doncker, Rik |
Mendeley readers
The data shown below were compiled from readership statistics for 13 Mendeley readers of this research output. Click here to see the associated Mendeley record.
Geographical breakdown
| Country | Count | As % |
|---|---|---|
| Unknown | 13 | 100% |
Demographic breakdown
| Readers by professional status | Count | As % |
|---|---|---|
| Student > Ph. D. Student | 3 | 23% |
| Student > Bachelor | 2 | 15% |
| Researcher | 1 | 8% |
| Unknown | 7 | 54% |
| Readers by discipline | Count | As % |
|---|---|---|
| Engineering | 2 | 15% |
| Physics and Astronomy | 2 | 15% |
| Chemical Engineering | 1 | 8% |
| Unknown | 8 | 62% |