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Metrology and Physical Mechanisms in New Generation Ionic Devices

Overview of attention for book
Cover of 'Metrology and Physical Mechanisms in New Generation Ionic Devices'

Table of Contents

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    Book Overview
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    Chapter 1 Introduction
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    Chapter 2 Filamentary-Based Resistive Switching
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    Chapter 3 Nanoscaled Electrical Characterization
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    Chapter 4 Conductive Filaments: Formation, Observation and Manipulation
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    Chapter 5 Three-Dimensional Filament Observation
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    Chapter 6 Reliability Threats in CBRAM
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    Chapter 7 Conclusions and Outlook
Attention for Chapter 6: Reliability Threats in CBRAM
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