You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output.
Click here to find out more.
Chapter title |
Improvement of RF-System to Measure Void Fraction of Cryogens
|
---|---|
Chapter number | 122 |
Book title |
Advances in Cryogenic Engineering
|
Published by |
Springer, Boston, MA, January 2000
|
DOI | 10.1007/978-1-4615-4215-5_122 |
Book ISBNs |
978-1-4613-6892-2, 978-1-4615-4215-5
|
Authors |
Yu. P. Filippov, A. M. Kovrizhnykh, S. V. Romanov |