↓ Skip to main content

Field Emission Scanning Electron Microscopy

Overview of attention for book
Attention for Chapter 7: X-Ray Imaging with a Silicon Drift Detector Energy Dispersive Spectrometer
Altmetric Badge

Citations

dimensions_citation
41 Dimensions

Readers on

mendeley
5 Mendeley
You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output. Click here to find out more.
Chapter title
X-Ray Imaging with a Silicon Drift Detector Energy Dispersive Spectrometer
Chapter number 7
Book title
Field Emission Scanning Electron Microscopy
Published by
Springer, Singapore, January 2018
DOI 10.1007/978-981-10-4433-5_7
Book ISBNs
978-9-81-104432-8, 978-9-81-104433-5
Authors

Nicolas Brodusch, Hendrix Demers, Raynald Gauvin

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 5 Mendeley readers of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 5 100%

Demographic breakdown

Readers by professional status Count As %
Student > Master 2 40%
Researcher 1 20%
Student > Ph. D. Student 1 20%
Unknown 1 20%
Readers by discipline Count As %
Computer Science 1 20%
Earth and Planetary Sciences 1 20%
Materials Science 1 20%
Chemistry 1 20%
Unknown 1 20%