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Chapter title |
Monte Carlo Simulation for Reliability Physics Modeling and Prediction of Scaled (100 nm) Silicon Mosfet Devices
|
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Chapter number | 20 |
Book title |
Future Trends in Microelectronics
|
Published by |
Springer, Dordrecht, January 1996
|
DOI | 10.1007/978-94-009-1746-0_20 |
Book ISBNs |
978-9-40-107280-9, 978-9-40-091746-0
|
Authors |
R. B. Hulfachor, J. J. Ellis-Monaghan, K. W. Kim, M. A. Littlejohn, Hulfachor, R. B., Ellis-Monaghan, J. J., Kim, K. W., Littlejohn, M. A. |