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Spintronics-based Computing

Overview of attention for book
Attention for Chapter 7: Statistical Reliability/Energy Characterization in STT-RAM Cell Designs
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Chapter title
Statistical Reliability/Energy Characterization in STT-RAM Cell Designs
Chapter number 7
Book title
Spintronics-based Computing
Published by
Springer, Cham, January 2015
DOI 10.1007/978-3-319-15180-9_7
Book ISBNs
978-3-31-915179-3, 978-3-31-915180-9
Authors

Wujie Wen, Yaojun Zhang, Yiran Chen

Mendeley readers

Mendeley readers

The data shown below were compiled from readership statistics for 1 Mendeley reader of this research output. Click here to see the associated Mendeley record.

Geographical breakdown

Country Count As %
Unknown 1 100%

Demographic breakdown

Readers by professional status Count As %
Researcher 1 100%
Readers by discipline Count As %
Unknown 1 100%